Automated Guinier Diffractometer and Camera for X-ray
Powder Diffraction at Temperatures between 10 and 450 K

• High resolution and high intensity:
  • e.g.: Si(220) reflection, recorded with CuK-Alpha 1 radiation (15.05981 nm):
    FWHM=0.075 deg (2-Theta), peak intensity 17000 cts, measuring time 30 sec/step
  • Novel setup (picture, 26kB) for computer controlled adjustment for transmission or reflection geometry
  • Data recording:
  • Two counters or film record the diffraction pattern
    
  • Monitor counter records the monochromatic primary beam
  
  
• Novel monochromator (picture, 43 kB) housing for Ge(111)
  ["A novel monochromator housing with completely shielded beam path from X-ray source to sample"
  J. Ihringer and K. R÷ttger, J. Appl. Cryst. (1994). 27, 1063-1065]
  
  
• Closed Cycle cryostat (picture, 44 kB) with removable sample holder (picture, 42 kB) equipped with furnace for continuous work from 10 to 450 K
  ["Adaption of a low-temperature X-ray Guinier diffractometer for use from 12 to 700 K "
  J. Ihringer and W. Appel, Rev. Sci. Instrum. (1984). 55 (12): 1978-1979)]
  
• Spinning sample at all temperatures within a He atmosphere to improve thermal contact at low temperatures

• Intensities at variable temperatures
  
• Thermal dependence of lattice constants "